Nanocharacterisation/ edited by Augus I Kirkland and John L Hutchison.
Material type: TextPublication details: London: RSC Publishing, 2007Edition: 1st edDescription: xiii, 304 p. : ill. ; 23 cmISBN: 9780854042418Subject(s): Nanotechnology | Electron MicroscopyDDC classification: 620.5 Online resources: Click here to access online
Contents:
Ch. 1. Characterisation of nanomaterials using transmission electron microscopy
Ch. 2. Scanning transmission electron microscopy
Ch. 3. Scanning tunneling microscopy of surfaces and nanostructures
Ch. 4. Electron energy-loss spectroscopy and energy dispersive x-ray analysis
Ch. 5. Electron holography of nanostructured materials
Ch. 6. Electron tomography
Ch. 7. In-situ environmental transmission electron microscopy
Item type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
General Books Science Library | Science Library, Sikkim University Science Library General Section | 620.5 KIR/N (Browse shelf(Opens below)) | Available | Books For SU Science Library | P11475 |
Total holds: 0
Ch. 1. Characterisation of nanomaterials using transmission electron microscopy
Ch. 2. Scanning transmission electron microscopy
Ch. 3. Scanning tunneling microscopy of surfaces and nanostructures
Ch. 4. Electron energy-loss spectroscopy and energy dispersive x-ray analysis
Ch. 5. Electron holography of nanostructured materials
Ch. 6. Electron tomography
Ch. 7. In-situ environmental transmission electron microscopy
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