Nanocharacterisation/
Nanocharacterisation/
edited by Augus I Kirkland and John L Hutchison.
- 1st ed.
- London: RSC Publishing, 2007.
- xiii, 304 p. : ill. ; 23 cm.
Ch. 1. Characterisation of nanomaterials using transmission electron microscopy
Ch. 2. Scanning transmission electron microscopy
Ch. 3. Scanning tunneling microscopy of surfaces and nanostructures
Ch. 4. Electron energy-loss spectroscopy and energy dispersive x-ray analysis
Ch. 5. Electron holography of nanostructured materials
Ch. 6. Electron tomography
Ch. 7. In-situ environmental transmission electron microscopy
9780854042418
Nanotechnology
Electron Microscopy
620.5 / KIR/N
Ch. 1. Characterisation of nanomaterials using transmission electron microscopy
Ch. 2. Scanning transmission electron microscopy
Ch. 3. Scanning tunneling microscopy of surfaces and nanostructures
Ch. 4. Electron energy-loss spectroscopy and energy dispersive x-ray analysis
Ch. 5. Electron holography of nanostructured materials
Ch. 6. Electron tomography
Ch. 7. In-situ environmental transmission electron microscopy
9780854042418
Nanotechnology
Electron Microscopy
620.5 / KIR/N