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Nanocharacterisation/ edited by Augus I Kirkland and John L Hutchison.

Contributor(s): edited by Kirkland, Augus IMaterial type: Text

TextPublication details: London: RSC Publishing, 2007Edition: 1st edDescription: xiii, 304 p. : ill. ; 23 cmISBN: 9780854042418Subject(s): Nanotechnology | Electron MicroscopyDDC classification: 620.5 Online resources: Click here to access online

Contents:

Ch. 1. Characterisation of nanomaterials using transmission electron microscopy Ch. 2. Scanning transmission electron microscopy Ch. 3. Scanning tunneling microscopy of surfaces and nanostructures Ch. 4. Electron energy-loss spectroscopy and energy dispersive x-ray analysis Ch. 5. Electron holography of nanostructured materials Ch. 6. Electron tomography Ch. 7. In-situ environmental transmission electron microscopy

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Holdings
Item type	Current library	Call number	Status	Notes	Date due	Barcode	Item holds
General Books Science Library	Science Library, Sikkim University Science Library General Section	620.5 KIR/N (Browse shelf(Opens below))	Available	Books For SU Science Library		P11475

Total holds: 0

Ch. 1. Characterisation of nanomaterials using transmission electron microscopy
Ch. 2. Scanning transmission electron microscopy
Ch. 3. Scanning tunneling microscopy of surfaces and nanostructures
Ch. 4. Electron energy-loss spectroscopy and energy dispersive x-ray analysis
Ch. 5. Electron holography of nanostructured materials
Ch. 6. Electron tomography
Ch. 7. In-situ environmental transmission electron microscopy

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