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001 978-3-319-98482-7
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020 _a9783319984827
_9978-3-319-98482-7
024 7 _a10.1007/978-3-319-98482-7
_2doi
050 4 _aTA404.6
072 7 _aTGMT
_2bicssc
072 7 _aTEC021000
_2bisacsh
072 7 _aTGMT
_2thema
082 0 4 _a620.11
_223
100 1 _aUl-Hamid, Anwar.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
245 1 2 _aA Beginners' Guide to Scanning Electron Microscopy
_h[electronic resource] /
_cby Anwar Ul-Hamid.
250 _a1st ed. 2018.
264 1 _aCham :
_bSpringer International Publishing :
_bImprint: Springer,
_c2018.
300 _aXXII, 402 p. 220 illus., 98 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _aIntroduction -- Components of the SEM -- Beam-Specimen Interaction -- Imaging with the SEM -- Microchemical Analysis with the SEM -- Sample Preparation.
520 _aThis book was developed with the goal of providing an easily understood text for those users of the scanning electron microscope (SEM) who have little or no background in the area. The SEM is routinely used to study the surface structure and chemistry of a wide range of biological and synthetic materials at the micrometer to nanometer scale. Ease-of-use, typically facile sample preparation, and straightforward image interpretation, combined with high resolution, high depth of field, and the ability to undertake microchemical and crystallographic analysis, has made scanning electron microscopy one of the most powerful and versatile techniques for characterization today. Indeed, the SEM is a vital tool for the characterization of nanostructured materials and the development of nanotechnology. However, its wide use by professionals with diverse technical backgrounds—including life science, materials science, engineering, forensics, mineralogy, etc., and in various sectors of government, industry, and academia—emphasizes the need for an introductory text providing the basics of effective SEM imaging. A Beginners’ Guide to Scanning Electron Microscopy explains instrumentation, operation, image interpretation and sample preparation in a wide ranging yet succinct and practical text, treating the essential theory of specimen-beam interaction and image formation in a manner that can be effortlessly comprehended by the novice SEM user. This book provides a concise and accessible introduction to the essentials of SEM includes a large number of illustrations specifically chosen to aid readers' understanding of key concepts highlights recent advances in instrumentation, imaging and sample preparation techniques offers examples drawn from a variety of applications that appeal to professionals from diverse backgrounds.
650 0 _aMaterials science.
650 0 _aSpectroscopy.
650 0 _aMicroscopy.
650 0 _aNanotechnology.
650 1 4 _aCharacterization and Evaluation of Materials.
_0https://scigraph.springernature.com/ontologies/product-market-codes/Z17000
650 2 4 _aSpectroscopy and Microscopy.
_0https://scigraph.springernature.com/ontologies/product-market-codes/P31090
650 2 4 _aNanotechnology and Microengineering.
_0https://scigraph.springernature.com/ontologies/product-market-codes/T18000
650 2 4 _aBiological Microscopy.
_0https://scigraph.springernature.com/ontologies/product-market-codes/L26000
650 2 4 _aNanotechnology.
_0https://scigraph.springernature.com/ontologies/product-market-codes/Z14000
856 4 0 _uhttps://doi.org/10.1007/978-3-319-98482-7
912 _aZDB-2-CMS
912 _aZDB-2-SXC
942 _cEBK
999 _c201939
_d201939