| 000 | 00325nam a2200133Ia 4500 | ||
|---|---|---|---|
| 999 |
_c156653 _d156653 |
||
| 020 | _a9780854042418 | ||
| 040 | _cCUS | ||
| 082 |
_a620.5 _bKIR/N |
||
| 245 | 0 |
_aNanocharacterisation/ _cedited by Augus I Kirkland and John L Hutchison. |
|
| 250 | _a1st ed. | ||
| 260 |
_aLondon: _bRSC Publishing, _c2007. |
||
| 300 |
_axiii, 304 p. : _bill. ; _c23 cm. |
||
| 505 | _aCh. 1. Characterisation of nanomaterials using transmission electron microscopy Ch. 2. Scanning transmission electron microscopy Ch. 3. Scanning tunneling microscopy of surfaces and nanostructures Ch. 4. Electron energy-loss spectroscopy and energy dispersive x-ray analysis Ch. 5. Electron holography of nanostructured materials Ch. 6. Electron tomography Ch. 7. In-situ environmental transmission electron microscopy | ||
| 650 | _aNanotechnology | ||
| 650 | _aElectron Microscopy | ||
| 700 | _aedited by Kirkland, Augus I | ||
| 856 | _uHutchison, John L | ||
| 942 | _cSC79 | ||