000			00383nam a2200133Ia 4500
999			_c153977 _d153977
020			_a9780387765013
040			_cCUS
082			_a621.381 _bWIL/T
100			_aWilliams, David B.
245		0	_aTransmission electron microscopy a textbook for materials science/ _cDavid B. Williams; C. Barry Carter
250			_a2nd ed.
260			_aNew York: _bSpringer, _c2009.
300			_alxii, 760 p.
505			_aBasics.- The Transmission Electron Microscope.- Scattering and Diffraction.- Elastic Scattering.- Inelastic Scattering and Beam Damage.- Electron Sources.- Lenses, Apertures, and Resolution.- How to `See' Electrons.- Pumps and Holders.- The Instrument.- Specimen Preparation.- Diffraction.- Diffraction in TEM.- Thinking in Reciprocal Space.- Diffracted Beams.- Bloch Waves.- Dispersion Surfaces.- Diffraction from Crystals.- Diffraction from Small Volumes.- Obtaining and Indexing Parallel-Beam Diffraction Patterns.- Kikuchi Diffraction.- Obtaining CBED Patterns.- Using Convergent-Beam Techniques.- Imaging.- Amplitude Contrast.- Phase-Contrast Images.- Thickness and Bending Effects.- Planar Defects.- Imaging Strain Fields.- Weak-Beam Dark-Field Microscopy.- High-Resolution TEM.- Other Imaging Techniques.- Image Simulation.- Processing and Quantifying Images.- Spectrometry.- X-ray Spectrometry.- X-ray Spectra and Images.- Qualitative X-ray Analysis and Imaging.- Quantitative X-ray Analysis.- Spatial Resolution and Minimum Detection.- Electron Energy-Loss Spectrometers and Filters.- Low-Loss and No-Loss Spectra and Images.- High Energy-Loss Spectra and Images.- Fine Structure and Finer Details.
650			_aTransmission electron microscopy.
650			_aMaterials -- Microscopy.
650			_aMicroscopy, Electron, Transmission.
700			_aCarter, C. Barry
942			_cWB16