000 | 00368nam a2200145Ia 4500 | ||
---|---|---|---|
999 |
_c153422 _d153422 |
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020 | _a9780201610918 | ||
040 | _cCUS | ||
082 |
_a543.62 _bCUL/E |
||
100 | _aCullity, B.D. | ||
245 | 0 |
_aElements of X-Ray diffraction/ _cB.D. Cullity and S.R. Stock |
|
250 | _a3rd ed. | ||
260 |
_aNew Jersey: _bPrentice Hall, _c2001. |
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300 |
_axviii, 678 p. : _bill. ; _c25 cm. |
||
505 | _aProperties of x-rays -- Geometry of crystals -- Diffraction I: Geometry -- Diffraction II: Intensities -- Diffraction III: Real samples -- Diffractometer measurements -- Powder photographs -- Laue photographs -- Phase identification by x-ray diffraction -- Determination of crystal structure -- Phase-diagram determination -- Quantitative phase analysis -- Precise parameter measurements -- Structure of polycrystalline aggregates -- Stress measurement -- Orientation of single crystals -- Crystal quality -- Polymers -- Small angle scattering -- Transmission electron microscopy. Ch. 1. Properties of X-Rays -- Ch. 2. Geometry of Crystals -- Ch. 3. Diffraction I: Geometry -- Ch. 4. Diffraction II: Intensities Diffraction II: Intensities -- Ch. 5. Diffraction III: Real Samples -- Ch. 6. Diffractometer Measurements -- Ch. 7. Powder Photographs -- Ch. 8. Laue Photographs -- Ch. 9. Phase Identification By X-Ray Diffraction -- Ch. 10. Determination of Crystal Structure -- Ch. 11. Phase-Diagram Determination -- Ch. 12. Quantitative Phase Analysis -- Ch. 13. Precise Parameter Measurements -- Ch. 14. Structure of Polycrystalline Aggregates -- Ch. 15. Stress Measurement -- Ch. 16. Orientation of Single Crystals -- Ch. 17. Crystal Quality -- Ch. 18. Polymers -- Ch. 19. Small Angle Scattering -- Ch. 20. Transmission Electron Microscopy -- App. 1. The Reciprocal Lattice -- App. 2. Electron and Neutron Diffraction -- App. 3. Lattice Geometry -- App. 4. The Rhombohedral-Hexagonal Transformation -- App. 5. Crystal Structure of Some Elements -- App. 6. Crystal Structures of Compounds and Solid Solutions -- App. 7. X-Ray Wavelengths -- App. 8. Mass Absorption Coefficients and Densities -- App. 9. Quadratic Forms of Miller Indices -- App. 10. Atomic Scattering Factors -- App. 11. Multiplicity Factors for the Powder Method -- App. 12. Lorentz-Polarization Factor -- App. 13. Data for Calculation of the Temperature Factor -- App. 14. Atomic Weights -- App. 15. Physical Constants. | ||
650 | _aX-rays--Diffraction | ||
650 | _aX-ray crystallography | ||
700 | _aStock, S.R. | ||
942 | _cWB16 |