Microeconometrics
Material type: TextPublication details: New York : Palgrave Macmillan, 2010Description: viii, 354 p. : ill. ; 24 cmISBN: 9780230238800 (hbk.)Subject(s): Microeconomics -- Econometric modelsDDC classification: 338.5015195Item type | Current library | Call number | Status | Date due | Barcode | Item holds |
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General Books | Central Library, Sikkim University General Book Section | 338.5015195 DUR/M (Browse shelf(Opens below)) | Available | P15689 |
All articles first published in The new Palgrave dictionary of economics, 2nd ed. in eight volumes, 2008 exception of Selection bias and self-selection which first published in The new Palgrave: a dictionary of economics, in four volumes, 1987.
Includes bibliographical references and index.
Categorical data / A. Colin Cameron -- Competing risks model / Gerard J. Van Den Berg -- Computational methods in econometrics / Vassilis A. Hajivassiliou -- Control functions / Salvador Navarro -- Decision theory in econometrics / Keisuke Hirano -- Difference-in-difference estimators / Alberto Abadie -- Exchangeability / David Draper -- Extreme bounds analysis / Edward E. Leamer -- Field experiments / John A. List and David Reiley -- Fixed effects and random effects / Badi H. Baltagi -- Identification / Jean-Marie Dufour and Cheng Hsiao -- Local regression models / Oliver B. Linton -- Logit models of individual choice / Thierry Magnac -- Longitudinal data analysis / Chang Hsiao -- Matching estimators / Petra E. Todd -- Maximum score methods / Robert P. Sherman -- Mixture models / Bruce G. Lindsay and Michael Stewart -- Natural experiments and quasi-natural experiments / J. Dinardo -- Nonlinear panel data models / Ekaterini Kyriazidou -- Nonparametric structural models / Rosa L. Matzklin -- Partial identification in econometrics / Charles F. Manski -- Partial linear model / Elie Tamer -- Propensity score / Jinyoung Hahn -- Proportional hazard model / Jerry A. Hausman and Tieman M. Woutersen -- Quantile regression / Moshe Buchinsky -- Regression-discontinuity analysis / Wilbert VanDerKlaauw -- Roy model / James J. Heckman and Christopher Taber -- Rubin causal model / Guido W. Imbens and Donald B. Rubin -- Selection bias and self-selection / James J. Heckman -- Semiparametric estimation / James L. Powell -- Simulation-based estimation / Eric Renault -- Social interactions (empirics) / Yannis M. Joannides -- Spatial econometrics / Timothy G. Conley -- Survey data, analysis of / Jeff Dominitz and Arthur Van Soest -- Tobit model / Jean-Marc Robin -- Treatment effect / Joshua D. Angrist -- Variance, analysis of / Andrew Gelman.
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