Nanocharacterisation/ 
edited by Augus I Kirkland and John L Hutchison. 
 - 1st ed. 
 - London:  RSC Publishing,  2007. 
 - xiii, 304 p. :  ill. ;  23 cm. 
<br/><br/>Ch. 1. Characterisation of nanomaterials using transmission electron microscopy <br/>Ch. 2. Scanning transmission electron microscopy <br/>Ch. 3. Scanning tunneling microscopy of surfaces and nanostructures <br/>Ch. 4. Electron energy-loss spectroscopy and energy dispersive x-ray analysis<br/>Ch. 5. Electron holography of nanostructured materials <br/>Ch. 6. Electron tomography <br/>Ch. 7. In-situ environmental transmission electron microscopy 
<br/><br/><label>ISBN: </label>9780854042418 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Nanotechnology<br/>Electron Microscopy
<br/><br/><label>Dewey Class. No.: </label>620.5  / KIR/N