X-ray structure determination: a practical guide/ George H. Stout, Lyle H. Jensen.

By: Stout, George HContributor(s): Jensen, Lyle HMaterial type: TextTextPublication details: New York : Wiley, c1989Edition: 2nd edDescription: xv, 453 p. : ill. ; 25 cmISBN: 0471607118Subject(s): X-ray crystallography | Radiocristallographie | Rayons X | KristallDDC classification: 548.83
Contents:
Machine derived contents note: Preliminary Stages. -- X-Rays. -- Diffraction of X-Rays. -- Crystals, Symmetry, and Space Groups. -- Crystals and Their Properties. -- Geometric Data Collection. -- Intensity Data Collection. -- Data Reduction. -- Theory of Structure Factors and Fourier Syntheses. -- Calculation of Structure Factors and Fourier Syntheses. -- The Phase Problem. -- The Phase Problem. -- Direct Methods. -- Patterson Methods. -- Heavy Atom Methods. -- Search Methods. -- Completing the Structure. -- Refinement And Results. -- Refinement of Crystal Structures. -- Random and Systematic Errors. -- Derived Results. -- Ambiguities and Uncertainties. -- Appendices. -- Index.
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Holdings
Item type Current library Call number Status Notes Date due Barcode Item holds
General Books Science Library General Books Science Library Science Library, Sikkim University
Science Library General Section
548.83 STO/X (Browse shelf(Opens below)) Available Books For SU Science Library P24646
Total holds: 0

"A Wiley-Interscience publication."

Includes bibliographical references and index.

Machine derived contents note: Preliminary Stages. -- X-Rays. -- Diffraction of X-Rays. -- Crystals, Symmetry, and Space Groups. -- Crystals and Their Properties. -- Geometric Data Collection. -- Intensity Data Collection. -- Data Reduction. -- Theory of Structure Factors and Fourier Syntheses. -- Calculation of Structure Factors and Fourier Syntheses. -- The Phase Problem. -- The Phase Problem. -- Direct Methods. -- Patterson Methods. -- Heavy Atom Methods. -- Search Methods. -- Completing the Structure. -- Refinement And Results. -- Refinement of Crystal Structures. -- Random and Systematic Errors. -- Derived Results. -- Ambiguities and Uncertainties. -- Appendices. -- Index.

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