Scanning Electron Microscopy and X-Ray Microanalysis (Record no. 202198)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 07823nam a22005535i 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9781493966769 |
| -- | 978-1-4939-6676-9 |
| 100 1# - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Goldstein, Joseph I. |
| 245 10 - TITLE STATEMENT | |
| Title | Scanning Electron Microscopy and X-Ray Microanalysis |
| Statement of responsibility, etc. | by Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy. |
| 250 ## - EDITION STATEMENT | |
| Edition statement | 4th ed. 2018. |
| 300 ## - DESCRIPTION | |
| Extent | XXIII, 550 p. 546 illus., 409 illus. in color. |
| 505 0# - FORMATTED CONTENTS NOTE | |
| Formatted contents note | Preface -- Scanning Electron Microscopy and Associated Techniques: Overview -- Electron Beam – Specimen Interactions: Interaction Volume -- Backscattered Electrons -- Secondary Electrons -- X-rays -- SEM Instrumentation -- Image Formation -- SEM Image Interpretation -- The Visibility of Features in SEM Images -- Image Defects -- High resolution imaging -- Low Beam Energy SEM -- Variable Pressure Scanning Electron Microscopy (VPSEM) -- ImageJ and Fiji -- SEM Imaging checklist -- SEM Case Studies -- Energy Dispersive X-ray Spectrometry: Physical Principles and User-Selected Parameters -- DTSA-II EDS Software -- Qualitative Elemental Analysis by Energy Dispersive X-ray Spectrometry -- Quantitative Analysis: from k-ratio to Composition -- Quantitative analysis: the SEM/EDS elemental microanalysis k-ratio procedure for bulk specimens, step-by-step -- Trace Analysis by SEM/EDS -- Low Beam Energy X-ray Microanalysis -- Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles -- Compositional Mapping -- Attempting Electron-Excited X-ray Microanalysis in the Variable Pressure Scanning Electron Microscope (VP-SEM) -- Energy Dispersive X-ray Microanalysis Checklist -- X-ray Microanalysis Case Studies -- Cathodoluminescence -- Characterizing crystalline materials in the SEM -- Focused Ion Beam Applications in the SEM laboratory -- Ion Beam Microscopy -- Appendix – A Database of Electron-Solid Interactions -- Index. |
| 650 #0 - SUBJECT | |
| Keyword | Materials science. |
| 650 #0 - SUBJECT | |
| Keyword | Spectroscopy. |
| 650 #0 - SUBJECT | |
| Keyword | Microscopy. |
| 650 #0 - SUBJECT | |
| Keyword | Physical measurements. |
| 650 #0 - SUBJECT | |
| Keyword | Measurement . |
| 650 14 - SUBJECT | |
| Keyword | Characterization and Evaluation of Materials. |
| 650 24 - SUBJECT | |
| Keyword | Spectroscopy and Microscopy. |
| 650 24 - SUBJECT | |
| Keyword | Biological Microscopy. |
| 650 24 - SUBJECT | |
| Keyword | Spectroscopy/Spectrometry. |
| 650 24 - SUBJECT | |
| Keyword | Measurement Science and Instrumentation. |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Newbury, Dale E. |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Michael, Joseph R. |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Ritchie, Nicholas W.M. |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Scott, John Henry J. |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Joy, David C. |
| 856 40 - ONLINE RESOURCES | |
| url | https://doi.org/10.1007/978-1-4939-6676-9 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | e-Books |
| 912 ## - | |
| -- | ZDB-2-CMS |
| 912 ## - | |
| -- | ZDB-2-SXC |
| Home library | Current library | Full call number | Accession number | Koha item type |
|---|---|---|---|---|
| Central Library, Sikkim University | Central Library, Sikkim University | 620.11 | E-3069 | e-Books |