Elements of X-Ray diffraction/ (Record no. 153422)
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000 -LEADER | |
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fixed length control field | 00368nam a2200145Ia 4500 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9780201610918 |
040 ## - CATALOGING SOURCE | |
Transcribing agency | CUS |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 543.62 |
Item number | CUL/E |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Cullity, B.D. |
245 #0 - TITLE STATEMENT | |
Title | Elements of X-Ray diffraction/ |
Statement of responsibility, etc. | B.D. Cullity and S.R. Stock |
250 ## - EDITION STATEMENT | |
Edition statement | 3rd ed. |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
Place of publication, distribution, etc. | New Jersey: |
Name of publisher, distributor, etc. | Prentice Hall, |
Date of publication, distribution, etc. | 2001. |
300 ## - PHYSICAL DESCRIPTION | |
Extent | xviii, 678 p. : |
Other physical details | ill. ; |
Dimensions | 25 cm. |
505 ## - FORMATTED CONTENTS NOTE | |
Formatted contents note | Properties of x-rays --<br/>Geometry of crystals --<br/>Diffraction I: Geometry --<br/>Diffraction II: Intensities --<br/>Diffraction III: Real samples --<br/>Diffractometer measurements --<br/>Powder photographs --<br/>Laue photographs --<br/>Phase identification by x-ray diffraction --<br/>Determination of crystal structure --<br/>Phase-diagram determination --<br/>Quantitative phase analysis --<br/>Precise parameter measurements --<br/>Structure of polycrystalline aggregates --<br/>Stress measurement --<br/>Orientation of single crystals --<br/>Crystal quality --<br/>Polymers --<br/>Small angle scattering --<br/>Transmission electron microscopy. Ch. 1. Properties of X-Rays --<br/>Ch. 2. Geometry of Crystals --<br/>Ch. 3. Diffraction I: Geometry --<br/>Ch. 4. Diffraction II: Intensities Diffraction II: Intensities --<br/>Ch. 5. Diffraction III: Real Samples --<br/>Ch. 6. Diffractometer Measurements --<br/>Ch. 7. Powder Photographs --<br/>Ch. 8. Laue Photographs --<br/>Ch. 9. Phase Identification By X-Ray Diffraction --<br/>Ch. 10. Determination of Crystal Structure --<br/>Ch. 11. Phase-Diagram Determination --<br/>Ch. 12. Quantitative Phase Analysis --<br/>Ch. 13. Precise Parameter Measurements --<br/>Ch. 14. Structure of Polycrystalline Aggregates --<br/>Ch. 15. Stress Measurement --<br/>Ch. 16. Orientation of Single Crystals --<br/>Ch. 17. Crystal Quality --<br/>Ch. 18. Polymers --<br/>Ch. 19. Small Angle Scattering --<br/>Ch. 20. Transmission Electron Microscopy --<br/>App. 1. The Reciprocal Lattice --<br/>App. 2. Electron and Neutron Diffraction --<br/>App. 3. Lattice Geometry --<br/>App. 4. The Rhombohedral-Hexagonal Transformation --<br/>App. 5. Crystal Structure of Some Elements --<br/>App. 6. Crystal Structures of Compounds and Solid Solutions --<br/>App. 7. X-Ray Wavelengths --<br/>App. 8. Mass Absorption Coefficients and Densities --<br/>App. 9. Quadratic Forms of Miller Indices --<br/>App. 10. Atomic Scattering Factors --<br/>App. 11. Multiplicity Factors for the Powder Method --<br/>App. 12. Lorentz-Polarization Factor --<br/>App. 13. Data for Calculation of the Temperature Factor --<br/>App. 14. Atomic Weights --<br/>App. 15. Physical Constants. |
650 ## - SUBJECT | |
Keyword | X-rays--Diffraction |
650 ## - SUBJECT | |
Keyword | X-ray crystallography |
700 ## - ADDED ENTRY--PERSONAL NAME | |
Personal name | Stock, S.R. |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | General Books |
Withdrawn status | Lost status | Damaged status | Not for loan | Home library | Current library | Shelving location | Date acquired | Full call number | Accession number | Date last seen | Date last checked out | Koha item type | Public note |
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Science Library, Sikkim University | Science Library, Sikkim University | Science Library General Section | 28/08/2016 | 543.62 CUL/E | P08203 | 22/05/2019 | 22/05/2019 | General Books Science Library | Books For SU Science Library |